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[IEEE 2007 32nd IEEE/CPMT International Electronic Manufacturing Technology Symposium - San Jose, CA, USA (2007.10.3-2007.10.5)] 2007 32nd IEEE/CPMT International Electronic Manufacturing Technology Symposium - Pb-free Solder: SAC105 vs SAC305 Drop-Test Reliability Data Comparison
Iyer, Ganesh, Ouyang, Eric, Kittidacha, Witoon, Tantideeravit, Soratos, Suresh, LKYear:
2007
Language:
english
DOI:
10.1109/iemt.2007.4417072
File:
PDF, 2.22 MB
english, 2007