[IEEE 2010 Design, Automation & Test in Europe...

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[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Worst case delay analysis for memory interference in multicore systems

Pellizzoni, Rodolfo, Schranzhofer, Andreas, Jian-Jia Chen,, Caccamo, Marco, Thiele, Lothar
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Year:
2010
Language:
english
DOI:
10.1109/date.2010.5456952
File:
PDF, 663 KB
english, 2010
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