![](/img/cover-not-exists.png)
[IEEE 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS) - Columbus, OH, USA (2013.08.4-2013.08.7)] 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS) - Modeling of transient faults and fault-tolerant design in nanoelectronics
Ban, Tian, Wang, Jianxin, An, Ting, Naviner, LiridaYear:
2013
Language:
english
DOI:
10.1109/mwscas.2013.6674706
File:
PDF, 599 KB
english, 2013