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[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - Test Generation for State Retention Logic
Chakravadhanula, Krishna, Chickermane, Vivek, Keller, Brion, Gallagher, Patrick, Gregor, StevenYear:
2008
Language:
english
DOI:
10.1109/ats.2008.73
File:
PDF, 359 KB
english, 2008