[IEEE 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2012.05.29-2012.06.1)] 2012 IEEE 62nd Electronic Components and Technology Conference - Modeling and reliability characterization of area-array electronics subjected to high-g mechanical shock up to 50,000g
Lall, Pradeep, Patel, Kewal, Lowe, Ryan, Strickland, Mark, Blanche, Jim, Geist, Dave, Montgomery, RandallYear:
2012
Language:
english
DOI:
10.1109/ectc.2012.6248988
File:
PDF, 9.42 MB
english, 2012