IEEE Transactions on Components Packaging and Manufacturing Technology Part A
1995 / 3 Vol. 18; Iss. 1
Simulations and measurements of picosecond signal transients, propagation, and crosstalk on lossy VLSI interconnect
Yungseon Eo,, Eisenstadt, W.R.Volume:
18
Language:
english
Journal:
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A
DOI:
10.1109/95.370758
Date:
March, 1995
File:
PDF, 961 KB
english, 1995