Atomic force microscopy investigation of buckling patterns...

Philosophical Magazine Letters 2002 / 09 Vol. 82; Iss. 9

Atomic force microscopy investigation of buckling patterns of nickel thin films on polycarbonate substrates

Cleymand, F., Coupeau, C., Grilhé, J.
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Volume:
82
Language:
english
Journal:
Philosophical Magazine Letters
DOI:
10.1080/09500830210154688
Date:
September, 2002
File:
PDF, 476 KB
english, 2002
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