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[IEEE 2014 83rd ARFTG Microwave Measurement Conference (ARFTG) - Tampa, FL, USA (2014.6.6-2014.6.6)] 83rd ARFTG Microwave Measurement Conference - A digital, PXI-based active load-pull tuner to maximize throughput of a load-pull test bench
Williams, Tudor, Wee, Brian, Saini, Randeep, Mathias, Simon, Bossche, Marc VandenYear:
2014
Language:
english
DOI:
10.1109/arftg.2014.6899527
File:
PDF, 1.64 MB
english, 2014