[IEEE Graphics (ICIG) - Hefei, Anhui, China...

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[IEEE Graphics (ICIG) - Hefei, Anhui, China (2011.08.12-2011.08.15)] 2011 Sixth International Conference on Image and Graphics - A Method for Detection and Classification of Glass Defects in Low Resolution Images

Zhao, Jie, Kong, Qing-Jie, Zhao, Xu, Liu, Jiapeng, Liu, Yuncai
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Year:
2011
Language:
english
DOI:
10.1109/icig.2011.187
File:
PDF, 564 KB
english, 2011
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