[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Failure analysis of VDMOS in DC/DC converter
Liu, Y., Huang, Ch. Y., Shan, N. N., Lu, Ch. Zh., Gao, G.B.Year:
2009
Language:
english
DOI:
10.1109/ipfa.2009.5232626
File:
PDF, 3.38 MB
english, 2009