[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Hydrodynamic modeling of RF noise in CMOS devices
Jungemann, C., Neinhus, B., Nguyen, C.D., Meinerzhagen, B., Dutton, R.W., Scholten, A.J., Tiemeijer, L.F.Year:
2003
Language:
english
DOI:
10.1109/iedm.2003.1269417
File:
PDF, 229 KB
english, 2003