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Self annealing effect on neutron irradiated silicon detectors by Hall effect analysis
Biggeri, U., Borchi, E., Bruzzi, M., Lazanu, S., Li, Z.Volume:
43
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.507154
Date:
June, 1996
File:
PDF, 507 KB
english, 1996