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[IEEE IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium - Honolulu, HI, USA (2010.07.25-2010.07.30)] 2010 IEEE International Geoscience and Remote Sensing Symposium - Crater detection based on marked point processes
Troglio, Giulia, Benediktsson, Jon A., Moser, Gabriele, Serpico, Sebastiano B.Year:
2010
Language:
english
DOI:
10.1109/igarss.2010.5651044
File:
PDF, 160 KB
english, 2010