[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - An RST-Tolerant Shape Descriptor for Object Detection
Su, Chih-Wen, Liao, Hong-Yuan Mark, Liang, Yu-Ming, Tyan, Hsiao-RongYear:
2010
Language:
english
DOI:
10.1109/icpr.2010.193
File:
PDF, 829 KB
english, 2010