[IEEE 2006 IEEE International High Level Design Validation and Test Workshop - Monterey, CA, USA (2006.11.8-2006.11.10)] 2006 IEEE International High Level Design Validation and Test Workshop - A Tool for Automatic Detection of Deadlock in Wormhole Networks on Chip
Taktak, Sami, Encrenaz, Emmanuelle, Desbarbieux, Jean-louYear:
2006
Language:
english
DOI:
10.1109/hldvt.2006.319992
File:
PDF, 8.44 MB
english, 2006