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[IEEE 2012 IEEE Applied Power Electronics Conference and Exposition - APEC 2012 - Orlando, FL, USA (2012.02.5-2012.02.9)] 2012 Twenty-Seventh Annual IEEE Applied Power Electronics Conference and Exposition (APEC) - Power loss measurement based on transient temperature rise
Kuebrich, Daniel, Goettle, Jens, Duerbaum, ThomasYear:
2012
Language:
english
DOI:
10.1109/apec.2012.6166065
File:
PDF, 1.67 MB
english, 2012