[IEEE 2008 International Conference on Smart Manufacturing application (ICSMA) - Goyang-si, South Korea (2008.04.9-2008.04.11)] 2008 International Conference on Smart Manufacturing Application - Online backlight unit tester based on area CCD
Wei, Tzu-Hsuan, Wen, Jen-Yu, Chiang, Wei-Chieh, Tsai, Ruei-Hung, Huang, Ting-Ming, Tsay, Ho-Lin, Liao, Tai-ShanYear:
2008
Language:
english
DOI:
10.1109/icsma.2008.4505574
File:
PDF, 2.13 MB
english, 2008