Radiation induced trap levels in SIMOX oxides: low...

IEEE Transactions on Nuclear Science 1998 / 6 Vol. 45; Iss. 3

Radiation induced trap levels in SIMOX oxides: low temperature thermally stimulated luminescence

Martini, M., Meinardi, F., Rosetta, E., Spinolo, G., Vedda, A., Leray, J.L., Paillet, P., Autran, J.L., Devine, R.A.B.
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Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685213
Date:
June, 1998
File:
PDF, 710 KB
english, 1998
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