[IEEE 2006 25th International Conference on Microelectronics - Belgrade, Serbia and Montenegro (14-17 May 2006)] 2006 25th International Conference on Microelectronics - Spontaneous Recovery in DC Gate Bias Stressed Power VDMOSFETs
Manic, I., Djoric-Veljkovic, S., Davidovic, V., Dankovic, D., Golubovic, S., Stojadinovic, N.Year:
2006
Language:
english
DOI:
10.1109/icmel.2006.1651038
File:
PDF, 645 KB
english, 2006