[IEEE 2009 IEEE International Conference on Electro/Information Technology (eit '09) - Windsor, ON, Canada (2009.06.7-2009.06.9)] 2009 IEEE International Conference on Electro/Information Technology - Thermal characterization of the VBIC dielectrically isolated device
Hossain, Md M., Davis, W. Alan, Russell, Howard T., Carter, Ronald L.Year:
2009
Language:
english
DOI:
10.1109/eit.2009.5189615
File:
PDF, 423 KB
english, 2009