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[IEEE 2011 American Control Conference - San Francisco, CA (2011.6.29-2011.7.1)] Proceedings of the 2011 American Control Conference - Rapid online quantification of tip-sample interaction for high-speed dynamic-mode atomic force microscope imaging
Busch, David, Ren, Juan, Qingze Zou,, Ganapathysubramanian, BaskarYear:
2011
Language:
english
DOI:
10.1109/acc.2011.5991007
File:
PDF, 493 KB
english, 2011