[IEEE IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society - Vienna, Austria (2013.11.10-2013.11.13)] IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society - A self optimizing autofocusing scheme for microscope integrated visual inspection systems
Baran, Eray A., Ayit, Orhan, Santiago, Victor B., Lopez-Doriga, Sergio, Sabanovic, AsifYear:
2013
Language:
english
DOI:
10.1109/iecon.2013.6699783
File:
PDF, 1.01 MB
english, 2013