[IEEE 2008 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Anchorage, AK, USA (2008.06.23-2008.06.28)] 2008 IEEE Conference on Computer Vision and Pattern Recognition - Sensing increased image resolution using aperture masks
Mohan, Ankit, Xiang Huang,, Tumblin, Jack, Raskar, RameshYear:
2008
Language:
english
DOI:
10.1109/cvpr.2008.4587833
File:
PDF, 2.30 MB
english, 2008