[IEEE 2009 3rd International Symposium on Empirical...

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[IEEE 2009 3rd International Symposium on Empirical Software Engineering and Measurement (ESEM) - Lake Buena Vista, FL, USA (2009.10.15-2009.10.16)] 2009 3rd International Symposium on Empirical Software Engineering and Measurement - The curse of copy&paste — Cloning in requirements specifications

Domann, Christoph, Juergens, Elmar, Streit, Jonathan
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Year:
2009
Language:
english
DOI:
10.1109/esem.2009.5315992
File:
PDF, 352 KB
english, 2009
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