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[IEEE 2012 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) - Singapore, Singapore (2012.05.21-2012.05.24)] 2012 Asia-Pacific Symposium on Electromagnetic Compatibility - Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs
Kwak, SangKeun, Jo, JeongMin, Noh, SeokSoon, Lee, HyeSook, Nah, Wansoo, Kim, SoYoungYear:
2012
Language:
english
DOI:
10.1109/apemc.2012.6237908
File:
PDF, 1.76 MB
english, 2012