[IEEE 2002 International Microwave Symposium (MTT 2002) - Seattle, WA, USA (2-7 June 2002)] 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278) - Field-tunable probe for combined electric and magnetic field measurements
Reano, R.M., Whitaker, J.F., Katehi, L.P.B.Volume:
3
Year:
2002
Language:
english
DOI:
10.1109/mwsym.2002.1012143
File:
PDF, 356 KB
english, 2002