[IEEE 2010 5th IEEE International Conference on Nano/Micro...

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[IEEE 2010 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS 2010) - Xiamen (2010.01.20-2010.01.23)] 2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems - The coupling error analysis of the decoupled silicon Micro-Gyroscope

Bo Yang,, Shourong Wang,, Hongsheng Li,, Libin Huang,, Kunyu Li,, Yong Yin,
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Year:
2010
Language:
english
DOI:
10.1109/nems.2010.5592238
File:
PDF, 186 KB
english, 2010
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