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[IEEE Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996 - Washington, DC, USA (1996.05.13-1996.05.17)] Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996 - Concept for an online material quality control by numerical simulation of a silicon ingot solidification process
Franke, D., Steinbach, I., Krumbe, W., Liebermann, J., Koch, W.Year:
1996
Language:
english
DOI:
10.1109/pvsc.1996.564064
File:
PDF, 633 KB
english, 1996