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[IEEE Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting - Tampa, FL (2006.10.8-2006.10.8)] Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting - A Parametric Model Approach to Arc Fault Detection for DC and AC Power Systems
Arunachalam, S., Diong, B.Volume:
5
Year:
2006
Language:
english
DOI:
10.1109/ias.2006.256855
File:
PDF, 236 KB
english, 2006