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[IEEE 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Shanghai, China (2010.11.1-2010.11.4)] 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - Numerical study on terahertz detection of MOS field-effect transistor
He, Frank, Yan, Zhifen, Zhu, Jingxuan, Wu, Wen, Liu, Zhiwei, Wang, Wenping, Ma, Yong, Zhang, Dongwei, Zhao, Wei, Cao, JunchengYear:
2010
Language:
english
DOI:
10.1109/icsict.2010.5667339
File:
PDF, 414 KB
english, 2010