[IEEE Proceedings of IEEE International Electron Devices Meeting - San Francisco, CA, USA (1989.12.3-1989.12.6)] International Technical Digest on Electron Devices Meeting - Hot-carrier degradation of p-MOSFET's in analog operation: the relevance of the channel-length-independent drain conductance degradation
Thewes,, Brox,, Tempel,, Weber,, Goser,Year:
1992
Language:
english
DOI:
10.1109/iedm.1992.307417
File:
PDF, 354 KB
english, 1992