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[IEEE 2012 4th IEEE International Memory Workshop (IMW) - Milan, Italy (2012.05.20-2012.05.23)] 2012 4th IEEE International Memory Workshop - Modeling of Threshold Voltage Drift in Phase Change Memory (PCM) Devices
Ciocchini, N., Cassinerio, M., Fugazza, D., Ielmini, D.Year:
2012
Language:
english
DOI:
10.1109/imw.2012.6213673
File:
PDF, 1.05 MB
english, 2012