[IEEE Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Bordeaux, France (2010.04.26-2010.04.28)] 2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE) - Vibration reliability of SMD Pb-free solder joints
Borras, Mario, Ratchev, Roumen, Lanier, Olivier, Guyenot, Michael, Coutellier, DanielYear:
2010
Language:
english
DOI:
10.1109/esime.2010.5464536
File:
PDF, 17.12 MB
english, 2010