Improved importance sampling for cone-beam simulations using SimSET
Harrison, R.L., Haynor, D.R., Vannoy, S.D., Lewellen, T.K.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.682001
Date:
June, 1998
File:
PDF, 524 KB
english, 1998