[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Evaluation of constant voltage testing for electromigration study
Zhang, Z., McGowan, B. T., Feldmaier, Z., Lloyd, J. R., McMullen, T., Wilcox, E., Schultz, S.Year:
2013
Language:
english
DOI:
10.1109/irps.2013.6532078
File:
PDF, 801 KB
english, 2013