[IEEE 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Rabat, Morocco (2007.09.2-2007.09.5)] 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Error probability in synchronous digital circuits due to power supply noise
Martorell, Ferran, Pons, Marc, Rubio, Antonio, Moll, FrancescYear:
2007
Language:
english
DOI:
10.1109/dtis.2007.4449513
File:
PDF, 469 KB
english, 2007