Characterization of cobalt nanowires by means of force...

IEEE Transactions on Magnetics 2000 / Sept. Vol. 36; Iss. 5

Characterization of cobalt nanowires by means of force microscopy

Garcia, J.M., Asenjo, A., Vazquez, M., Aranda, P., Ruiz-Hitzky, E.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.908647
Date:
January, 2000
File:
PDF, 62 KB
english, 2000
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