A Detailed Study of Gate Insulator Process Dependence of...

IEEE Transactions on Electron Devices 2014 / 02 Vol. 61; Iss. 2

A Detailed Study of Gate Insulator Process Dependence of NBTI Using a Compact Model

Joshi, Kaustubh, Mukhopadhyay, Subhadeep, Goel, Nilesh, Nanware, Nirmal, Mahapatra, Souvik
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2295844
Date:
February, 2014
File:
PDF, 1.77 MB
english, 2014
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