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[IEEE 18th International Reliability Physics Symposium - Las Vegas, NV, USA (1980.04.8-1980.04.10)] 18th International Reliability Physics Symposium - Reliability Influences from Electrical Overstress on LSI Devices
Hart, Arthur, Teng, Tsuo-Tong, McKenna, ArnYear:
1980
Language:
english
DOI:
10.1109/irps.1980.362938
File:
PDF, 8.61 MB
english, 1980