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[IEEE ESSDERC 2008 - 38th European Solid-State Device Research Conference - Edinburgh, UK (2008.09.15-2008.09.19)] ESSDERC 2008 - 38th European Solid-State Device Research Conference - Origin of the flat-band voltage (Vfb) roll-off phenomenon in metal/high-k gate stacks
Bersuker, G., Park, C. S., Wen, H. C., Choi, K., Sharia, O., Demkov, A.Year:
2008
Language:
english
DOI:
10.1109/essderc.2008.4681717
File:
PDF, 316 KB
english, 2008