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[IEEE 2006 IEEE MTT-S International Microwave Symposium Digest - San Francisco, CA (2006.06.11-2006.06.16)] 2006 IEEE MTT-S International Microwave Symposium Digest - EM-Based Statistical Analysis and Yield Estimation Using Linear-Input and Neural-Output Space Mapping
Rayas-sanchez, Jose, Gutierrez-Ayala, VladimirYear:
2006
Language:
english
DOI:
10.1109/mwsym.2006.249641
File:
PDF, 4.12 MB
english, 2006