[IEEE 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004. - Tel Aviv, Israel (Dec. 13-15, 2004)] Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004. - Morton (Z) scan based real-time variable resolution CMOS image sensor
Artyomov, E., Rivenson, Y., Levi, G., Yadid-Pecht, O.Year:
2004
Language:
english
DOI:
10.1109/icecs.2004.1399635
File:
PDF, 645 KB
english, 2004