[IEEE International Electron Devices Meeting. Technical Digest - San Francisco, CA, USA (8-11 Dec. 1996)] International Electron Devices Meeting. Technical Digest - An FT-CCD imager with true 2.4×2.4 μm/sup 2/ pixels in double membrane poly-Si technology
Peek, H.L., Verbugt, D.W., Beenhakkers, M.J., Huinink, W.F., Kleimann, K.C.Year:
1996
Language:
english
DOI:
10.1109/iedm.1996.554126
File:
PDF, 770 KB
english, 1996