[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - A Gradient Descent Approach for Multi-modal Biometric Identification
Basak, Jayanta, Kate, Kiran, Tyagi, Vivek, Ratha, NaliniYear:
2010
Language:
english
DOI:
10.1109/icpr.2010.329
File:
PDF, 394 KB
english, 2010