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[IEEE Networks (DSN) - Chicago, IL, USA (2010.06.28-2010.07.1)] 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) - Detecting vulnerabilities in C programs using trace-based testing
Dazhi Zhang,, Donggang Liu,, Yu Lei,, Kung, David, Csallner, Christoph, Wenhua Wang,Year:
2010
Language:
english
DOI:
10.1109/dsn.2010.5544310
File:
PDF, 638 KB
english, 2010