[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Performance and Reliability Feature of Nanocrystal Memory Devices
Wang, Liudi, Zhang, Zhigang, Zeng, Ying, Zhao, Yue, Zhang, Xiang, Pan, Liyang, Zhu, JunYear:
2006
Language:
english
DOI:
10.1109/icsict.2006.306520
File:
PDF, 79 KB
english, 2006