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[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - New circuit model for investigating plasma damage in FDSOI devices
Akbal, M., Ribes, G., Poiroux, T., Carrere, J-P., Vallier, L.Year:
2014
Language:
english
DOI:
10.1109/irps.2014.6861165
File:
PDF, 721 KB
english, 2014