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[IEEE Thirty-Sixth IEEE Conference on Electrical Contacts, and the Fifteenth International Conference on Electrical Contacts - Montreal, Que., Canada (20-24 Aug. 1990)] Thirty-Sixth IEEE Conference on Electrical Contacts, and the Fifteenth International Conference on Electrical Contacts - Multiple-electrode probe assemblies and nondestructive testing of high-capacity joints
Morin, F., Parker, M., Rousseau, G., Saint-Louis, M.Year:
1990
Language:
english
DOI:
10.1109/holm.1990.113039
File:
PDF, 590 KB
english, 1990