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[IEEE Digest of Papers. 1992 IEEE VLSI Test Symposium - Atlantic City, NJ, USA (7-9 April 1992)] Digest of Papers. 1992 IEEE VLSI Test Symposium - Self-testing and self-checking combinational circuits with weakly independent outputs
Sogomonjan, E.S., Goessel, M.Year:
1992
Language:
english
DOI:
10.1109/vtest.1992.232769
File:
PDF, 429 KB
english, 1992