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[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors
Ashouei, Maryam, Bhattacharya, Soumendu, Chatterjee, AbhijitYear:
2007
Language:
english
DOI:
10.1109/vts.2007.50
File:
PDF, 367 KB
english, 2007